BÄURLE, David; HERGUTH, Axel; HAHN, Giso. Approaches to Reduce the Impact of Edge Recombination in Si Lifetime Samples With Emitter. SiliconPV Conference Proceedings, [S. l.], v. 3, 2025. DOI: 10.52825/siliconpv.v3i.2700. Disponível em: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/2700. Acesso em: 21 dec. 2025.