PAREEK, Arti; MEENA, Roopmati; GUPTA, Rajesh. Investigation of Degradation in 20-Year-Field-Exposed PV Modules From India by Cross-Characterization Using Electroluminescence Imaging and Thermography. SiliconPV Conference Proceedings, [S. l.], v. 1, 2024. DOI: 10.52825/siliconpv.v1i.867. Disponível em: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/867. Acesso em: 25 may. 2024.