Bäurle D, Herguth A, Hahn G. Approaches to Reduce the Impact of Edge Recombination in Si Lifetime Samples With Emitter. SiliconPV Conf Proc [Internet]. 2025 Dec. 17 [cited 2025 Dec. 21];3. Available from: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/2700