Correlating Structure Loss and Operational Conditions in Czochralski Silicon Ingot Growth Using Machine Learning
DOI:
https://doi.org/10.52825/siliconpv.v3i.2682Keywords:
Machine Learning, Structure Loss, Czochralski Silicon IngotsAbstract
This work investigates the relationships between process parameters and the occurrence of structure loss in Czochralski silicon ingots using machine learning. Subsets of features are identified from a dataset of over 14,000 ingots and are used to train random forests to predict structure loss with high accuracy. Multiple rounds of feature importance analysis and refinement are conducted to isolate the process parameters that may have the most significant impact in the occurrence of structure loss. Partial dependence analysis is employed to examine how variations in particular parameters might affect the likelihood of structure loss happening. The results show that the most predictive features of structure loss are primarily recorded late in the process. These features are often influenced by manual interventions or reflect the outcome of structure loss itself. In contrast, early-stage parameters exhibit limited predictive power, suggesting that either early indicators of structure loss are not captured in the available data or that structure loss originates from events occurring later in the growth process. While not predictive in a preventive sense, the model effectively detects deviations from normal operation, thereby demonstrating the value of machine learning for uncovering complex patterns in manufacturing processes data.
Downloads
References
[1] Fraunhofer Institute for Solar Energy Systems ISE. “Photovoltaics Report─Fraunhofer ISE.” Fraunhofer ISE. https://www.ise.fraunhofer.de/en/publications/studies/photovoltaics-report.html (accessed Apr. 01, 2024).
[2] Czochralski, J. “Ein neues Verfahren zur Messung der Kristallisationsgeschwindigkeit der Metalle.” Zeitschrift für Physikalische Chemie 92U, no. 1 (November 1, 1918): 219–21. https://doi.org/10.1515/zpch-1918-9212.
[3] Garcia, A. S., Hendawi, R., & Di Sabatino, M. (2024). Machine Learning Methods for Structure Loss Classification in Czochralski Silicon Ingots. Crystal Growth & Design. https://doi.org/10.1021/acs.cgd.4c00760
[4] Di Sabatino, M., Hendawi, R., & Garcia, A. S. (2024). Silicon Solar Cells: Trends, Manu-facturing Challenges, and AI Perspectives. Crystals, 14(2), Article 2. https://doi.org/10.3390/cryst14020167
[5] Hendawi, R., and Di Sabatino M. (2024)“Analyzing Structure Loss in Czochralski Silicon Growth: Root Causes Investigation through Surface Examination.” Journal of Crystal Growth 629 https://doi.org/10.1016/j.jcrysgro.2023.127564.
[6] Hendawi, R., Schön H., and Di Sabatino M. (2025) “Data Analysis of Industrial Czochral-ski Process: Investigation of Ingots with Structure Loss.” Solar Energy Materials and Solar Cells 283 https://doi.org/10.1016/j.solmat.2025.113438.
[7] MachineLearningMastery.com. “Statistical Methods for Machine Learning.” Accessed April 1, 2025. https://machinelearningmastery.com/statistics_for_machine_learning/.
[8] Breiman, L. “Random Forests.” Machine Learning 45, no. 1 (October 1, 2001): 5–32. https://doi.org/10.1023/A:1010933404324.
Published
How to Cite
Conference Proceedings Volume
Section
License
Copyright (c) 2025 Alfredo Sanchez Garcia, Rania Hendawi, Hendrik Schön, Marisa Di Sabatino

This work is licensed under a Creative Commons Attribution 4.0 International License.
Accepted 2025-10-10
Published 2026-01-06